Boundary Scan JTAG Controllers

Corelis has developed a wide range of boundary-scan high-performance controllers that are compatible with busses such as PCI, PCI Express, USB 2.0, Ethernet PC Card, and more. Most of Corelis' boundary-scan controllers operate up to 80MHz sustained TCK frequency some even up to 100MHz. This wide choice of platforms allows you to select the appropriate level and cost of boundary-scan hardware tester for the application while maintaining complete software transportability across all platforms. The table below lists the various JTAG controllers offered by Corelis. A brief description of each controller follows. There are also older types of controllers based on VME, PIO, VXI and ISA bus available upon request.

 

USB-1149.1/1E

The USB-1149.1/1E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
The voltage level of the parallel I/O and the TAP interface is software programmable and can be set to any voltage between 1.25V and 3.3V in increments of 0.05V. The USB-1149.1/1E TCK output to the IEEE Standard 1149.1 compatible target system is programmable under software control and supports speeds of up to 100MHz.

Other features include automatic signal delay compensation for long cable lengths to the UUT, programmable slew rate control on the TAP signals, and I2C/SPI peripheral interfaces to support programming serial EEPROM devices.

For complete information on the USB-1149.1/1E, please refer to the detailed datasheet for this product.

Datasheet.

 

USB-1149.1/4E

The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification (backward compatible with the full-speed features of Revision 1.1).

The voltage level of the parallel I/O and the TAP interface is software programmable and can be set to any voltage between 1.25V and 3.3V in increments of 0.05V. The USB-1149.1/4E TCK output to the IEEE Standard 1149.1 compatible target system is programmable under software control and supports speeds of up to 100MHz.
For complete information on the USB-1149.1/4E, please refer to the detailed datasheet for this product.

Datasheet.

 

NetUSB-1149.1/E

The NetUSB-1149.1/E™ (4 TAPs) and NetUSB-1149.1/SE™ (8 TAPs) are advanced USB 2.0 and LAN-based controllers that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The controllers support concurrent (gang) testing and in-system programming of CPLD's and Flash devices at TCK rates up to 80MHz. Up to 8,000 boards can be tested and programmed concurrently! The NetUSB-1149.1/SE also supports an analog voltage measuring capability.

The controllers connect to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals and GPIO discrete signals which are individually programmable from 1.25V to 3.3V (5 volt tolerant), programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.

For complete information on these two controllers, please refer to the detailed data sheets.

NetUSB-1149.1/E Datasheet.

 

NetUSB-1149.1/SE

The NetUSB-1149.1/SE (8 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/SE controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. The NetUSB-1149.1/SE also supports an analog voltage measuring capability.

The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.

For complete information on these two controllers, please refer to the detailed datasheets.

NetUSB-1149.1/SE Datasheet

 

PCI-1149.1/Turbo

The PCI-1149.1/Turbo is a powerful PCI-based controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. When combined with a pod, such as the ScanTAP-4, the PCI-1149.1/Turbo supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. The Controller connects to the pod with a high performance SCSI ribbon cable available in lengths up to 30-feet for easy installation at remote locations.

Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.3V to 3.3V, programmable slew rate control, and pre-power up test for shorts between power and ground lines on the UUT.

Datasheet.

 

PCIe
PCIe-1149.1

The PCIe-1149.1 is an advanced robust system that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. When combined with a pod, such as the ScanTAP-4, the PCIe-1149.1 supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. The Controller connects to the pod with a high performance SCSI ribbon cable available in lengths up to 30-feet for easy installation at remote locations.

Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.3V to 3.3V, programmable slew rate control, and pre-power up test for shorts between power and ground lines on the UUT.

Datasheet.

 

CPXI
CPXI-1149.1/Turbo

The  CPXI-1149.1/Turbo™ is an advanced PXI/cPCI-based controller that is used for testing and in-system programming of devices, boards, or systems compliant with the IEEE-1149.1 standard. When combined with a pod, such as the ScanTAP-4, the CPXI-1149.1/Turbo supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz. The controller connects to the pod with a high performance SCSI ribbon cable available in lengths up to 30-feet for easy installation at remote locations. Other features include automatic signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control, and pre-power up test for shorts between power and ground traces on the UUT.

Datasheet.

 

 
QuadTap CFM
High-Performance Multi-TAP Boundary-Scan Controller for Teradyne In-Circuit-Testers

Circuit board complexity continues to increase. As physical test access recedes, non-intrusive test methods such as boundary-scan and JTAG embedded test are positioned to close the test coverage gaps, ensuring that test technology keeps pace with design advances such as multi-TAP systems.

The Corelis QuadTAP/CFM™ high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.

Specifically designed for integration into Teradyne TestStation™ and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.

Datasheet.

 

 
USB-1149.1/CFM
High-Performance Boundary-Scan Controller for Teradyne In-Circuit-Testers

The USB-1149.1/CFM™ High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation™ and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.

Adding boundary-scan without losing the ICT investment is an attractive prospect-by combining ICT and boundary-scan, test engineers are achieving the benefits of these complementary technologies and the highest possible test coverage.

For complete information on this controller, please refer to the detailed datasheets

Datasheet.

 

CAS-1000-I2C/E

The CAS-1000-I2C/E™ has all the power, flexibility, and features you need to debug, test, and validate the I2C bus circuitry on your board. It provides all the functionality of the BusPro-I analyzer and also provides many additional advanced features geared towards IC verification and parametric testing. The CAS-1000-I2C/E can be used to monitor and log I2C bus traffic in real-time, generate I2C transactions to communicate with peripheral components on the bus, perform in-system programming of I2C EEPROMs, perform master and slave device emulation via scripting, validate bus specification compliance, perform electrical and timing parameter measurement, perform glitch injection, perform clock stretching, and perform adjustable timing skew.

The CAS-1000-I2C/E is an enhanced model targeted towards IC verification and parametric testing in addition to powerful monitoring and debug functionality.

More info. Datasheet.